NEN-EN-IEC 61967-6
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
active
| Organization: | NEN |
| Publication Date: | 1 November 2002 |
| Status: | active |
| Page Count: | 66 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1000 MHz. This method is applicable to the measurement of a single IC or a chip set if ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method".
Document History
November 1, 2010
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
A description is not available for this item.
June 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
A description is not available for this item.
NEN-EN-IEC 61967-6
November 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of...