NEN-EN-IEC 61967-6/C1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 November 2010 |
| Status: | active |
| Page Count: | 3 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History
NEN-EN-IEC 61967-6/C1
November 1, 2010
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
A description is not available for this item.
June 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
A description is not available for this item.
November 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of...