NEN-ISO/IEC 10373-3
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
active
| Organization: | NEN |
| Publication Date: | 1 October 2010 |
| Status: | active |
| Page Count: | 64 |
| ICS Code (Identification cards. Chip cards. Biometrics): | 35.240.15 |
scope:
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications.
Document History
September 1, 2013
Identification cards Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
A description is not available for this item.
NEN-ISO/IEC 10373-3
October 1, 2010
Identification cards - Test methods - Part 3: Integrated circuit cards with contacts and related interface devices
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each...
March 1, 2001
Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices
Defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices according the the definition given in ISO/IEC 7816. Each test-method is...