BSI - BS IEC 62951-1
Semiconductor devices – Flexible and stretchable semiconductor devices Part 1: Bending test method for conductive thin films on flexible substrates
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| Organization: | BSI |
| Publication Date: | 31 May 2018 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
BS IEC 62951-1
May 31, 2018
Semiconductor devices – Flexible and stretchable semiconductor devices Part 1: Bending test method for conductive thin films on flexible substrates
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