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BSI - 18/30375624 DC

Draft BS EN 60749-20-1 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

pending
Organization: BSI
Publication Date: 13 July 2018
Status: pending
Page Count: 39
ICS Code (Semiconductor devices in general): 31.080.01

Document History

18/30375624 DC
July 13, 2018
Draft BS EN 60749-20-1 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
A description is not available for this item.
July 31, 2009
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
A description is not available for this item.

References

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