CENELEC - EN 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
inactive
| Organization: | CENELEC |
| Publication Date: | 1 April 2008 |
| Status: | inactive |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
November 1, 2022
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
This part of IEC 60749 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an...
EN 60749-37
April 1, 2008
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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