CENELEC - EN 60749-10
Semiconductor Devices - Mechanical and Climatic Test Methods Part 10: Mechanical Shock
inactive
| Organization: | CENELEC |
| Publication Date: | 28 August 2002 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 1, 2022
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
This part of IEC 60749 is intended to evaluate devices in the free state and assembled to printed wiring boards for use in electrical equipment. The method is intended to determine the compatibility...
EN 60749-10
August 28, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods Part 10: Mechanical Shock
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