ECIA - EIA-364-25
TP-25C Probe Damage Test Procedure for Electrical Connectors
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| Organization: | ECIA |
| Publication Date: | 1 May 1998 |
| Status: | inactive |
| Page Count: | 14 |
scope:
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. The purpose of this test is to simulate a form of field abuse of contacts during test by inserting probes into connector socket contacts.
Document History
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
November 1, 2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
EIA-364-25
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
January 1, 1983
TP-25A Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.