ECIA - EIA-364-25B
TP-25B Probe Damage Test Procedure for Electrical Connectors
inactive
| Organization: | ECIA |
| Publication Date: | 1 April 1997 |
| Status: | inactive |
| Page Count: | 9 |
Document History
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
November 1, 2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
EIA-364-25B
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
January 1, 1983
TP-25A Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.