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ECIA - EIA-364-25E

TP-25E Probe Damage Test Procedure for Electrical Connectors

active, Most Current
Organization: ECIA
Publication Date: 1 March 2017
Status: active
Page Count: 13
scope:

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:

- to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;

- to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).

Document History

March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
EIA-364-25E
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
November 1, 2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
January 1, 1983
TP-25A Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.

References

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