DOD - SMD 5962-94511
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 9 PARALLEL SYNCHRONOUS FIFO, MONOLITHIC SILICON
| Organization: | DOD |
| Publication Date: | 20 November 2009 |
| Status: | inactive |
| Page Count: | 26 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator.Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number 1/ Circuit function Access time 01 4K × 9 CMOS Parallel Synchronous FIFO 50 ns 02 4K × 9 CMOS Parallel Synchronous FIFO 35 ns 03 4K × 9 CMOS Parallel Synchronous FIFO 25 ns 04 4K × 9 CMOS Parallel Synchronous FIFO 20 ns
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535
The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style X CQCC1-N32 32 Rectangular leadless chip carrier
The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.
Terminal voltage with respect to ground .......... −0.5 V dc to +7.0 V dc
DC output current ....................
Supply voltage (VCC) ....................
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) ............ 3/ percent
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits... View More
Document History