BSI - BS EN 62047-6
Semiconductor devices - Micro-electromechanical devices Part 6: Axial fatigue testing methods of thin film materials
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| Organization: | BSI |
| Publication Date: | 30 April 2010 |
| Status: | active |
| Page Count: | 20 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
BS EN 62047-6
April 30, 2010
Semiconductor devices - Micro-electromechanical devices Part 6: Axial fatigue testing methods of thin film materials
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