BSI - BS EN 62047-2
Semiconductor devices Micro-electromechanical devices Part 2: Tensile testing method of thin film materials
active, Most Current
Buy Now
| Organization: | BSI |
| Publication Date: | 30 November 2006 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
BS EN 62047-2
November 30, 2006
Semiconductor devices Micro-electromechanical devices Part 2: Tensile testing method of thin film materials
A description is not available for this item.
Related Products
Searching for related products...