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BSI - BS EN 62047-3

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

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Organization: BSI
Publication Date: 30 November 2006
Status: active
Page Count: 12
ICS Code (Other semiconductor devices): 31.080.99

Document History

BS EN 62047-3
November 30, 2006
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
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References

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