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ISO 18115-2

Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy

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Organization: ISO
Publication Date: 15 July 2010
Status: inactive
Page Count: 56
ICS Code (Chemical analysis): 71.040.40
ICS Code (Chemical technology (Vocabularies)): 01.040.71
scope:

ISO 18115 defines terms for surface chemical analysis. Part 1 covers general terms and those used in spectroscopy while this part covers terms used in scanning-probe microscopy.

Document History

18115-2
December 1, 2021
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
This document defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this document covers terms used in scanning probe microscopy.
ISO 18115-2
November 15, 2013
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
This International Standard defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this part of ISO 18115 covers terms used in...
ISO 18115-2
July 15, 2010
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
ISO 18115 defines terms for surface chemical analysis. Part 1 covers general terms and those used in spectroscopy while this part covers terms used in scanning-probe microscopy.

References

This document is referenced by:
ASTM E2859 - Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Published by ASTM on December 1, 2011
The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates...
This document is referenced by:
ASTM E1217 - Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
Published by ASTM on November 1, 2011
This practice describes methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers (spectrometer...
This document is referenced by:
ISO TS 10797 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
Published by ISO on June 1, 2012
This Technical Specification establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT...
This document is referenced by:
ISO 23833 - Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
Published by ISO on April 15, 2013
This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a...
This document is referenced by:
ISO 11039 - Surface chemical analysis — Scanningprobe microscopy — Measurement of drift rate
Published by ISO on February 1, 2012
This International Standard defines terms and specifies measurement methods for characterizing the drift rates of scanning-probe microscopy (SPM) instruments in the X- and Y‑directions and, for SPM...
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