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ISO 18115-2

Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy

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Organization: ISO
Publication Date: 15 November 2013
Status: active
Page Count: 52
ICS Code (Chemical analysis): 71.040.40
ICS Code (Chemical technology (Vocabularies)): 01.040.71
scope:

This International Standard defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this part of ISO 18115 covers terms used in scanning-probe microscopy.

Document History

18115-2
December 1, 2021
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
This document defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this document covers terms used in scanning probe microscopy.
ISO 18115-2
November 15, 2013
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
This International Standard defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this part of ISO 18115 covers terms used in...
ISO 18115-2
July 15, 2010
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
ISO 18115 defines terms for surface chemical analysis. Part 1 covers general terms and those used in spectroscopy while this part covers terms used in scanning-probe microscopy.

References

This document is referenced by:
ASTM E2735 - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Published by ASTM on February 1, 2014
This guide describes an approach to enable users and analysts to determine the calibrations and standards useful to obtain meaningful surface chemistry data with X-ray photoelectron spectroscopy...
This document is referenced by:
ISO 13095 - Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Published by ISO on July 15, 2014
This International Standard specifies two methods for characterizing the shape of an AFM probe tip, specifically the shank and approximate tip profiles. These methods project the profile of an AFM...
This document is referenced by:
ASTM E1078 - Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Published by ASTM on October 1, 2014
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
This document is referenced by:
ASTM E1829 - Standard Guide for Handling Specimens Prior to Surface Analysis
Published by ASTM on October 1, 2014
This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES), X-ray photoelectron...
This document is referenced by:
ISO 18118 - Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Published by ISO on April 1, 2015
This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger...
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