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ISO - 18115-2

Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy

active, Most Current
Organization: ISO
Publication Date: 1 December 2021
Status: active
Page Count: 52
ICS Code (Chemical analysis): 71.040.40
ICS Code (Chemical technology (Vocabularies)): 01.040.71
scope:

This document defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this document covers terms used in scanning probe microscopy.

Document History

18115-2
December 1, 2021
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
This document defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this document covers terms used in scanning probe microscopy.
ISO 18115-2
November 15, 2013
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
This International Standard defines terms for surface chemical analysis. ISO 18115-1 covers general terms and those used in spectroscopy while this part of ISO 18115 covers terms used in...
ISO 18115-2
July 15, 2010
Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy
ISO 18115 defines terms for surface chemical analysis. Part 1 covers general terms and those used in spectroscopy while this part covers terms used in scanning-probe microscopy.

References

This document is referenced by:
NEN-EN-ISO 21363 - Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Published by NEN on February 1, 2022
This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale. This document broadly is...
This document is referenced by:
SN EN ISO 21363 - Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Published by SNV on January 1, 2022
This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale.This document broadly is...
This document is referenced by:
23729 - Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Published by ISO on July 1, 2022
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe...
This document is referenced by:
EN ISO 21363 - Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
Published by CEN on January 1, 2022
This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale. This document broadly is...
This document is referenced by:
18115-3 - Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
Published by ISO on June 1, 2022
This document defines terms for surface chemical analysis in the area of optical interface analysis including ellipsometry, Raman spectroscopy and nonlinear optical techniques as well as general...
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