ISO - 23729
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Organization: | ISO |
Publication Date: | 1 July 2022 |
Status: | active |
Page Count: | 22 |
ICS Code (Chemical analysis): | 71.040.40 |
scope:
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
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