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DOD - SMD 5962-86828

MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 22 November 2010
Status: inactive
Page Count: 13
scope:

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD-5962-86828 REV F
May 16, 2022
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD 5962-86828
December 22, 2015
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREESTATE OUTPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD 5962-86828
November 22, 2010
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-86828 REV C
June 18, 2004
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-86828 REV B
March 15, 1988
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-86828 REV A
September 23, 1987
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-86828
September 22, 1986
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX BUFFER/DRIVER WITH INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
JEDEC JESD 7 - 54/74HCXXXX and 54/74HCTXXXX High Speed CMOS Devices, Description of
Published by JEDEC on January 1, 1986
This standard provides uniformity, multiplicity of sources, eliminate confusion, and ease of device specification and design by users for HC, and HCT CMOS devices. This standard specifies electrical...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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