DOD - SMD 5962-06229
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
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| Organization: | DOD |
| Publication Date: | 18 September 2018 |
| Status: | active |
| Page Count: | 24 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD 5962-06229
September 18, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
October 12, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 25, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 19, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 2, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 12, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 21, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...