DOD - SMD 5962-06229
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
inactive
Buy Now
| Organization: | DOD |
| Publication Date: | 25 August 2010 |
| Status: | inactive |
| Page Count: | 22 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
September 18, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
October 12, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-06229
August 25, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 19, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 2, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 12, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 21, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...