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BSI - 19/30392174 DC

Draft BS EN 60747-5-6 Semiconductor devices. Part 5-6: Optoelectronic devices - Light emitting diodes.

pending, Most Current
Organization: BSI
Publication Date: 20 February 2019
Status: pending
Page Count: 90
ICS Code (Other semiconductor devices): 31.080.99

Document History

19/30392174 DC
February 20, 2019
Draft BS EN 60747-5-6 Semiconductor devices. Part 5-6: Optoelectronic devices - Light emitting diodes.
A description is not available for this item.

References

This document references:
IEC 60050-845 - International electrotechnical vocabulary (IEV) – Part 845: Lighting
Published by IEC on December 1, 2020
This part of IEC 60050 gives the general terminology used in lighting, as well as general terms pertaining to specific applications and associated technologies. This second edition reviews and...
This document references:
IEC 60068-2-30 - Environmental testing – Part 2-30: Tests – Test Db: Damp heat, cyclic (12 h + 12 h cycle)
Published by IEC on August 1, 2005
This part of IEC 60068 determines the suitability of components, equipment or other articles for use, transportation and storage under conditions of high humidity – combined with cyclic temperature...
This document references:
IEC 60664-1 - Insulation coordination for equipment within low-voltage supply systems – Part 1: Principles, requirements and tests
Published by IEC on May 1, 2020
This part of IEC 60664 deals with insulation coordination for equipment having a rated voltage up to AC 1 000 V or DC 1 500 V connected to low-voltage supply systems. This document applies to...
This document references:
IEC 60749-10 - Semiconductor Devices - Mechanical and Climatic Test Methods - Part 10: Mechanical Shock CORRIGENDUM 1
Published by IEC on August 1, 2003
A description is not available for this item.
This document references:
IEC 60749-12 - Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
Published by IEC on December 1, 2017
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
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