ESD SP5.3.3

Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing – Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method

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Organization: ESD
Publication Date: 5 October 2018
Status: active
Page Count: 28
scope:

This standard practice establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multichip modules (MCMs) containing any of these devices can be characterized according to this standard practice.

PURPOSE

The purpose of this standard practice is to define a low impedance contact-based test method for charged device model (CDM) characterization.

Document History

ESD SP5.3.3
October 5, 2018
Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing – Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method
This standard practice establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM...

References

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