Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing – Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method
|Publication Date:||5 October 2018|
This standard practice establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multichip modules (MCMs) containing any of these devices can be characterized according to this standard practice.
The purpose of this standard practice is to define a low impedance contact-based test method for charged device model (CDM) characterization.