DOD - SMD 5962-87699

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 26 February 2019
Status: active
Page Count: 29
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes

Document History

SMD 5962-87699
February 26, 2019
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
December 21, 2016
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
September 24, 2013
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
October 16, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
March 7, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
August 31, 2005
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B, and Q) and space application (device classes S and V). A choice of case outlines and...
September 9, 2004
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
July 12, 2002
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
April 24, 1998
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
December 29, 1992
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
July 10, 1992
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
September 30, 1988
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.

References

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