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DOD - SMD 5962-88501

MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 10 September 2019
Status: active
Page Count: 42
scope:

Scope.

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-88501
September 10, 2019
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD 5962-88501
April 16, 2012
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-88501
June 26, 2007
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD 5962-88501
December 3, 2001
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-88501
December 21, 2000
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".
SMD 5962-88501
November 21, 1994
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88501 REV C
July 7, 1993
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-88501 REV B
October 30, 1991
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88501 REV A
August 15, 1990
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88501
February 16, 1989
MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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