IEC 62047-7
Semiconductor devices – Micro-electromechanical devices – Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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| Organization: | IEC |
| Publication Date: | 1 June 2011 |
| Status: | active |
| Page Count: | 60 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 62047 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.
Document History
IEC 62047-7
June 1, 2011
Semiconductor devices – Micro-electromechanical devices – Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
This part of IEC 62047 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and...