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DOD - SMD 5962-93216

MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/ DUAL/ QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 25 July 2011
Status: inactive
Page Count: 16
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

April 2, 2018
MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/ DUAL/ QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-93216
July 25, 2011
MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/ DUAL/ QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 13, 2002
MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
A description is not available for this item.
March 28, 1995
MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
A description is not available for this item.
February 28, 1994
MICROCIRCUIT, LINEAR, LOW NOISE, HIGH SPEED, SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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