UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

CENELEC - EN 61837-2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

inactive
Organization: CENELEC
Publication Date: 1 July 2011
Status: inactive
Page Count: 90
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.

Document History

EN IEC 61837-2
July 1, 2018
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN IEC 61837-2
July 1, 2018
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
July 1, 2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
July 1, 2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
November 1, 2000
Surface Mounted Piezoelectric Devices for Frequency Control and Selection - Standard Outlines and Terminal Lead Connections Part 2: Ceramic Enclosures
A description is not available for this item.

References

This document references:
ISO 1101 - Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out
Published by ISO on February 1, 2017
This document defines the symbol language for geometrical specification of workpieces and the rules for its interpretation. It provides the foundation for geometrical specification. The illustrations...
This document references:
IEC 61019-2 - Surface Acoustic Wave (SAW) Resonators - Part 2: Guide to the Use
Published by IEC on May 1, 2005
A description is not available for this item.
This document references:
IEC 60862-2 - Surface acoustic wave (SAW) filters of assessed quality – Part 2: Guidelines for the use
Published by IEC on May 1, 2012
This part of IEC 60862 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be...
This document references:
IEC 60368-1 - Piezoelectric filters of assessed quality – Part 1: Generic specification
Published by IEC on May 1, 2013
This part of IEC 60368 specifies the methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 60122-2 - Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection
Published by IEC on January 1, 1983
A description is not available for this item.
View Less
View All
Advertisement