DS/EN 61967-8
Integrated circuits – Measurement of electromagnetic emissions – Part 8: Measurement of radiated emissions – IC stripline method
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| Organization: | DS |
| Publication Date: | 22 November 2011 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
Document History
DS/EN 61967-8
November 22, 2011
Integrated circuits – Measurement of electromagnetic emissions – Part 8: Measurement of radiated emissions – IC stripline method
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range...
Integrated circuits - Measurement of electromagnetic emissions -- Part 8: Measurement of radiated emissions - IC stripline method
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range...
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 8: Measurement of radiated emissions - IC stripline method
This measurement procedure defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz....
References
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