The Protection of EOS/ESD Susceptible Items - Electrical Overstress in Manufacturing and Test
|Publication Date:||1 January 2020|
This document covers certain aspects of the control, mitigation, and monitoring of electrical stresses which may cause EOS damage. These stresses may occur during the processing, assembly, installation, or testing, of electrical or electronic parts, assemblies, and equipment. In general, this includes sources of excessive voltage, current or power.
NOTE: Electrostatic discharge (ESD) is one possible root cause of EOS damage. However, several other ESDA documents  cover ESD control and event mitigation.
NOTE: This document does not apply to electrically-initiat
This document is the first in a series of documents intended to provide information that will promote the reduction of electrical overstress (EOS) damage in manufacturing and test, and provide the knowledge base for on-going mitigation and monitoring for possibly damaging electrical stresses. This document will be revised and expanded as others in the industry come forward with additional best practices used in their facilities. The content in this version represents best practices that have been shared and reviewed up to the time of its submission for publication.