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JEDEC JEP 174

Understanding Electrical Overstress - EOS

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Organization: JEDEC
Publication Date: 1 September 2016
Status: active
Page Count: 174
scope:

The scope of this white paper is damage to integrated circuits and systems caused by electrical stress, the terms and definitions associated with electrical stress to these integrated circuits and systems and the mitigation of this electrical stress event as it applies to integrated circuits and systems.

Document History

JEDEC JEP 174
September 1, 2016
Understanding Electrical Overstress - EOS
The scope of this white paper is damage to integrated circuits and systems caused by electrical stress, the terms and definitions associated with electrical stress to these integrated circuits and...

References

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