DLA - SMD-5962-06240 REV E
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 22 September 2021 |
| Status: | active |
| Page Count: | 24 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD-5962-06240 REV E
September 22, 2021
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
November 8, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
June 23, 2011
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 8, 2009
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 17, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 21, 2006
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...