UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

New! AI Engineering Assistant 
- Trained on our vast library of engineering resources.

DLA - DSCC-VID-V62/22607

MICROCIRCUIT, LINEAR, 2 MHz CURRENT MODE PWM CONTROLLERS, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 1 June 2022
Status: active
Page Count: 20
scope:

Scope.

This drawing documents the general requirements of a high performance 2 MHz current mode pulse width modulator (PWM) microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-VID-V62/22607
June 1, 2022
MICROCIRCUIT, LINEAR, 2 MHz CURRENT MODE PWM CONTROLLERS, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance 2 MHz current mode pulse width modulator (PWM) microcircuit, with an operating temperature range of -55°C to +125°C.

References

This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
JS-002 - Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
Published by ESD on April 6, 2022
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
This document references:
JEDEC JEP 155 - Recommended ESD Target Level for HBM Qualification
Published by JEDEC on July 1, 2018
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP157A - Recommended ESD-CDM Target Levels
Published by JEDEC on April 1, 2022
The intent of this report is to document and provide critical information to assess and make decisions on safe CDM ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP95 JEDEC STD NO. 95-1 - JEDEC Standard No. 95-1 Section 4 Design Guidelines
Published by JEDEC on March 1, 1997
INTRODUCTION History JEDEC REGISTERED AND STANDARD OUTLINES FOR SEMICONDUCTOR DEVICES, JEDEC PUBLICATION 95, is the official JEDEC Publication that contains the registered or standard mechanical...
This document references:
JS-001 - Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Device Level
Published by JEDEC on May 1, 2023
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
View Less
View All
Advertisement