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DLA - SMD-5962-94681 REV D

MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 9 September 2022
Status: active
Page Count: 10
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD-5962-94681 REV D
September 9, 2022
MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
October 26, 2015
MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
April 3, 2006
MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 2, 2001
MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON
A description is not available for this item.
June 14, 1994
MICROCIRCUIT, LINEAR, +10 V VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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