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DLA - DSCC-VID-V62/22609

MICROCIRCUIT, LINEAR, SINGLE CHANNEL LOAD SWITCH, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 22 December 2022
Status: inactive
Page Count: 14
scope:

Scope.

This drawing documents the general requirements of a high performance single channel load switch microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-VID-V62/22609 REV A
February 3, 2023
MICROCIRCUIT, LINEAR, SINGLE CHANNEL LOAD SWITCH, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance single channel load switch microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/22609
December 22, 2022
MICROCIRCUIT, LINEAR, SINGLE CHANNEL LOAD SWITCH, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance single channel load switch microcircuit, with an operating temperature range of -55°C to +125°C.

References

This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
JEDEC JEP 155 - Recommended ESD Target Level for HBM Qualification
Published by JEDEC on July 1, 2018
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP157A - Recommended ESD-CDM Target Levels
Published by JEDEC on April 1, 2022
The intent of this report is to document and provide critical information to assess and make decisions on safe CDM ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP95 BOOKS 1-3/95-1 - Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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