IEC - 63287-2
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 March 2023 |
| Status: | active |
| Page Count: | 34 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Document History
63287-2
March 1, 2023
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the...