SAE International - J2052_200512
Test Device Head Contact Duration Analysis
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| Organization: | SAE International |
| Publication Date: | 14 December 2005 |
| Status: | active |
description:
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Document History
July 12, 2016
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
January 5, 2011
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
J2052_200512
December 14, 2005
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
December 1, 1997
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
March 1, 1990
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.