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DOD - SMD 5962-91584

MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 24 April 2012
Status: active
Page Count: 21
scope:

This drawing form a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". when available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1/ Circuit function Access time 01 Registered combinatorial 25 ns 02 Registered combinatorial 20 ns

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CDIP3-T28 or GDIP4-T28 28 Duel-in-line 2/ Y GDFP2-F28 28 Flat pack 2/ Z GQCC1-J28 28 "J" lead chip carrier 2/ 3 CQCC1-N28 28 Square leadless chip carrier 2/

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range to ground potential (VCC). . . . . −0.5 V dc to +7.0 V dc Output voltage range applied. . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc DC input voltage range. . . . . . . . . . . . . . . . . −3.0 V dc to +7.0 V dc Maximum power dissipation (PD). . . . . . . . . . . . . 1.0 W 4/ Lead temperature (soldering 10 seconds) . . . . . . . . +260°C Thermal resistance, junction-to-case (θJC). . . . . . . See MIL-STD-1835 Maximum junction temperature (TJ) . . . . . . . . . . . +175°C Storage temperature range (TSTG) . . . . . . . . . . . −65°C to +150°C Temperature under bias . . . . . . . . . . . . . . . . −55°C to +125°C Output current into outputs (low) . . . . . . . . . . . 12 mA Endurance . . . . . . . . . . . . . . . . . . . . . . . 25 erase/write cycles (minimum)

Supply voltage range (VCC) . . . . . . . . . . . . . . +4.5 V dc minimum to +5.5 V dc maximum Ground voltage (GND) . . . . . . . . . . . . . . . . . 0.0 V dc Input high voltage (VIH) . . . . . . . . . . . . . . . 2.2 V dc minimum Input low voltage (VIL) . . . . . . . . . . . . . . . . 0.8 V dc maximum Case operating temperature range (TC) . . . . . . . . . −55°C to +125°C

Fault coverage measurement of manufacturing Logic tests (MIL-STD-883, test method 5012) . . . . . . 5/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

May 2, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
SMD 5962-91584
April 24, 2012
MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing form a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, M) and...
October 20, 1992
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing form a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, M) and...

References

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