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CEI - EN 62047-7

Semiconductor devices - Micro-electromechanical devices Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

active, Most Current
Organization: CEI
Publication Date: 1 June 2012
Status: active
Page Count: 34
ICS Code (Other semiconductor devices): 31.080.99
scope:

This part of IEC 62047 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

Document History

EN 62047-7
June 1, 2012
Semiconductor devices - Micro-electromechanical devices Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
This part of IEC 62047 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and...

References

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