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BSI - BS EN 62132-8

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

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Organization: BSI
Publication Date: 31 October 2012
Status: active
Page Count: 26
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN 62132-8
October 31, 2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
A description is not available for this item.

References

This document references:
IEC 61000-4-20 - Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by IEC on August 1, 2010
Scope and object This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These...
This document references:
IEC 62132-1 - Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
Published by IEC on October 1, 2015
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
EN 61000-4-20 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by CENELEC on November 1, 2010
Scope and object This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These...
This document references:
BS EN 62132-1 - Integrated circuits — Measurement of electromagnetic immunity Part 1: General conditions and definitions
Published by BSI on March 31, 2016
A description is not available for this item.
This document references:
EN 62132-1 - Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Published by CENELEC on February 1, 2016
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
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