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BSI - BS PD IEC/TS 62686-1

Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors

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Organization: BSI
Publication Date: 31 October 2012
Status: inactive
Page Count: 66
ICS Code (Production. Production management): 03.100.50
ICS Code (Aerospace electric equipment and systems): 49.060

Document History

BS PD IEC TS 62686-1
April 30, 2020
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
A description is not available for this item.
BS PD IEC/TS 62686-1
April 30, 2015
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
A description is not available for this item.
BS PD IEC/TS 62686-1
October 31, 2012
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
A description is not available for this item.
BS DD IEC/PAS 62686-1
July 31, 2011
Process management for avionics - Aerospace qualified electronic components (AQEC) Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
A description is not available for this item.

References

This document references:
JEDEC JESD 531 - Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)
Published by JEDEC on July 1, 1986
This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that...
This document references:
JEDEC JESD 52 - Description of Low Voltage TTL-Compatible CMOS Logic Devices
Published by JEDEC on November 1, 1995
This standard describes dc interface specifications and test environment for these devices that operate with 2.7 V to 3.6 V power supplies. The goal is to provide a consistent set of dc...
This document references:
JEDEC JESD 51-2 - Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
Published by JEDEC on January 1, 2008
This document outlines the environmental conditions necessary to ensure accuracy and repeatability for a standard junction-to-ambient thermal resistance measurement in natural convection.
This document references:
JEDEC JESD 51-1 - Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
Published by JEDEC on December 1, 1995
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form...
This document is referenced by:
BS DD IEC TS 62239 - Process management for avionics Preparation of an electronic components management plan
Published by BSI on August 14, 2003
A description is not available for this item.
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