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IEC 62276

Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods

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Organization: IEC
Publication Date: 1 October 2012
Status: inactive
Page Count: 86
ICS Code (Piezoelectric devices): 31.140
scope:

This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Document History

IEC 62276
October 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
IEC 62276
October 1, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
IEC 62276
May 1, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
A description is not available for this item.
IEC/PAS 62276
August 1, 2001
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
A description is not available for this item.

References

This document references:
IEC 60758 - Synthetic quartz crystal – Specifications and guidelines for use
Published by IEC on May 1, 2016
This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications
This document references:
IEC 60862-1 - Surface acoustic wave (SAW) filters of assessed quality – Part 1: Generic specification
Published by IEC on August 1, 2015
This part of IEC 60862 specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 60862-2 - Surface acoustic wave (SAW) filters of assessed quality – Part 2: Guidelines for the use
Published by IEC on May 1, 2012
This part of IEC 60862 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be...
This document is referenced by:
IEC TS 61994-4-4 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
Published by IEC on November 1, 2018
This part of IEC 61994 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art.
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