IEC 62276
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
inactive
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| Organization: | IEC |
| Publication Date: | 1 May 2005 |
| Status: | inactive |
| Page Count: | 40 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
October 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
October 1, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
IEC 62276
May 1, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
A description is not available for this item.
August 1, 2001
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
A description is not available for this item.