IEC/PAS 62276
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
inactive
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| Organization: | IEC |
| Publication Date: | 1 August 2001 |
| Status: | inactive |
| Page Count: | 40 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
October 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
October 1, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
May 1, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
A description is not available for this item.
IEC/PAS 62276
August 1, 2001
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
A description is not available for this item.