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IEC - PAS 62276

Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method

inactive
Organization: IEC
Publication Date: 1 August 2001
Status: inactive
Page Count: 40
ICS Code (Piezoelectric devices): 31.140

Document History

October 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
October 1, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
May 1, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
A description is not available for this item.
PAS 62276
August 1, 2001
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
A description is not available for this item.
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