IEEE 1546
Guide for Digital Test Interchange Format (DTIF) Application
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| Organization: | IEEE |
| Publication Date: | 21 September 2000 |
| Status: | active |
| Page Count: | 38 |
scope:
This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a user perspective, giving examples and directions showing how to implement and use the DTIF. The intent of the document is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998.
Purpose
This guide is meant to provide an aid in the understanding and use of DTIF files. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.
Document History
IEEE 1546
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a...
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
Foreword
IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF), provides a mechanism for digital test data interchange independent of a specific digital automatic test program...
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
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