UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEEE 1546

Guide for Digital Test Interchange Format (DTIF) Application

active, Most Current
Buy Now
Organization: IEEE
Publication Date: 21 September 2000
Status: active
Page Count: 38

Document History

IEEE 1546
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a...
IEEE 1546
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
Foreword IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF), provides a mechanism for digital test data interchange independent of a specific digital automatic test program...
IEEE 1546
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
A description is not available for this item.
Advertisement