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IEEE 1546

Guide for Digital Test Interchange Format (DTIF) Application

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Organization: IEEE
Publication Date: 21 September 2000
Status: active
Page Count: 38
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Foreword

IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF), provides a mechanism for digital test data interchange independent of a specific digital automatic test program generator and automatic test equipment. This guide is supplementary to IEEE Std 1445-1998.

The purpose of this guide is to provide an aid in the understanding and use of DTIF files. This application guide will provide information that will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.

Scope

This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-19981 ) to do so. The guide explains the DTIF from a user perspective, giving examples and directions showing how to implement and use the DTIF. The intent of the document is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998.

Document History

September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a...
IEEE 1546
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
Foreword IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF), provides a mechanism for digital test data interchange independent of a specific digital automatic test program...
September 21, 2000
Guide for Digital Test Interchange Format (DTIF) Application
A description is not available for this item.

References

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