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NPFC - MIL-M-38510/349

MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 30 September 1983
Status: inactive
Page Count: 17

Document History

MIL-M-38510/349B VALID NOTICE 4
July 14, 2023
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/349
September 20, 2018
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/349
December 6, 2013
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/349
February 26, 2009
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead...
MIL-M-38510/349
May 12, 2004
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead...
MIL-M-38510/349
July 12, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
October 22, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
March 20, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
October 1, 1986
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, advanced schottky TTL, parity checker microcircuit. Two product assurance classes and a choice of case outlines and lead...
MIL-M-38510/349 (1)
August 19, 1985
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
September 30, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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