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NPFC - MIL-M-38510/349

MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 1 October 1986
Status: inactive
Page Count: 18
scope:

This specification covers the detail requirements for monolithic silicon, advanced schottky TTL, parity checker microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number.

The part number shall be in accordance with MIL-M-38510.

The device type shall be as follows:

Device type Circuit 01 9-bit odd/even parity generator/checker

The device class shall be the product assurance level as defined in MIL-M-38510.

The case outlines shall be designated as follows.

Outline letter Case outline (MIL-M-38510, appendix C) A F-1 (14-lead, ¼" × ¼"), flat package B F-3 (14-lead, 3/16" × ¼"), flat package C D-1 (14-lead, ¼" × ¾"), dual-in-line package D F-2 (14-lead, ¼" × ⅜"), flat package 2 C-2 (20 terminal, .350" × .350"), square chip carrier package

Supply voltage range - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range - - - - - - - - - - - - - - - −1.2 V dc at −18 mA to +7.0 V dc Storage temperature range - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) per device 1/ - - - 220 mW Lead temperature (soldering, 10 seconds) - - - - - 300°C Thermal resistance, junction-to-case (θJC): Cases A, B, C, and D - - - - - - - - - - - - - (See MIL-M-38510, appendix C) Case 2 - - - - - - - - - - - - - - - - - - - - 60°C/W 2/ Junction temperature (TJ) 3/ - - - - - - - - - +175°C

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Rome Air Development Center (RBE-2), Griffiss AFB, NY 13441, by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.

Supply voltage (VCC) - - - - - - - - - - - - - - 4.5 V dc to 5.5 V dc Minimum high level input voltage (VIH) - - - - - 2.0 V dc Maximum low level input voltage (VIL) - - - - - 0.8 V dc Case operating temperature range (TC) - - - - - −55°C to +125°C

intended Use:

Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.

Document History

Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
September 20, 2018
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
December 6, 2013
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
February 26, 2009
Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead...
May 12, 2004
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead...
July 12, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
October 22, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
March 20, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/349
October 1, 1986
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, advanced schottky TTL, parity checker microcircuit. Two product assurance classes and a choice of case outlines and lead...
August 19, 1985
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
September 30, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.

References

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