CENELEC - EN 60444-6
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
active
| Organization: | CENELEC |
| Publication Date: | 1 October 2013 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. "Reference Method B", based on the π- network or reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. "Method C", an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
Document History
October 1, 2021
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based...
EN 60444-6
October 1, 2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based...
April 1, 1997
Measurement of Quartz Crystal Unit Parameters Part 6: Measurement of Drive Level Dependence (DLD)
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